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- MI-SIM Pro+
MI-SIM Pro+
Description
MI-SIM Pro+ is an advanced structured illumination microscopy platform for demanding live-cell and multi-dimensional imaging experiments. The system provides resolution down to 60 nm in X–Y and combines 2D, 3D and TIRF-SIM imaging with advanced software functions for sample overview, multi-position acquisition, intelligent tracking and event-based imaging.
Its high sensitivity allows researchers to capture rapid subcellular dynamics while reducing photobleaching and phototoxicity, making the system suitable for both fast acquisition and extended observation of living samples.
Related products
Product description
MI-SIM Pro+ is an advanced structured illumination microscopy platform for demanding live-cell and multi-dimensional imaging experiments. The system provides resolution down to 60 nm in X–Y and combines 2D, 3D and TIRF-SIM imaging with advanced software functions for sample overview, multi-position acquisition, intelligent tracking and event-based imaging.
Its high sensitivity allows researchers to capture rapid subcellular dynamics while reducing photobleaching and phototoxicity, making the system suitable for both fast acquisition and extended observation of living samples.Features
- Resolution down to 60 nm in X–Y and 200 nm in Z
- 2D, 3D and TIRF structured illumination microscopy
- More than 300 reconstructed frames per second
- Real-time super-resolution reconstruction and preview
- Multi-position and multi-modal imaging
- Large-field image acquisition and stitching
- Intelligent cell and object tracking
- AI-based object recognition
- Event-based triggering and feedback microscopy
- Advanced reconstruction using Hessian SIM and SPARSE deconvolution
- Integrated acquisition, reconstruction and analysis software
- Standard TIF output compatible with third-party analysis software
